Gerald Lopez (M9) '01, computer engineering, presented at the 2009 IEEE International Interconnect Technology Conference in Sapporo, Japan on June 1st.
His presentation topic, "A New Physical Model and Experimental Measurements of Copper Interconnect Resistivity Considering Size Effects and Line-Edge Roughness (LER)," can be viewed on youtube by clicking here.
Gerald Lopez is in the Ph.D. program in The School of Electrical and Computer Engineering at The Georgia Institute of Technology.