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Seminar: Wednesday, November 5, 2008 at 3:30pm

A CCD Based Multiwavelength X-ray Diffractometer
Keith Gendreau
NASA Goddard Space Flight Center

We have made a new type of X-ray Diffractometer that uses CCD technology developed for X-ray astrophysics. The instrument provides X-ray diffraction and fluorescence information from unprepared samples. This can be used to identify minerals and provide surface texture information. The instrument is designed to minimize mass, power, and risk for planetary exploration.

Location: Physics Bldg., Room 401
Coffee: 3:15 p.m.